UNITES Systems a.s. - Innovative ATE Solutions, semiconductor testing, test and measurement - Bench top test systems, UNIMET 4000H
UNIMET 4000H
UNIMET 4000H represents a mixed-signal test platform for cost effective testing of hybrids or customer specific ICs. UNIMET 4000H uses digital pin electronics and various types of sources available for effective testing of hybrids. The standard test adapters cannot be used with UNIMET 4000H. The programming of the test applications is done under programming language DELPHI.
HW specification
Basic configuration of test station includes following modules:
- 16-bit precision voltmeter with auto-calibration
- S&H and RMS converter units
- 6× ±16V/200mA voltage sources
- 3× precision 4Q VI sources ±52V/500mA
- 2× ±51V/250mA (4A pulsed) voltage sources
- +51V/2.5A voltage source (continuous)
- ±51V/10mA LCM voltage source
- Leakage current measurement down to 100nA range, 50pA resolution
- 96 Open Collectors
- Current source up to 250mA, 1.25nA resolution
- Analog stimuli (Ramp and Sinus generators)
- Digital stimuli and data acquisition
- Time/frequency measurement with level detectors with 125ps resolution
- SMX32B Kelvin matrix 8×4
- DDPEL Digital Pin Electronics – 8 channels featuring: 1ns edge placement on-the-fly, 2M vectors memory and analog MUX for DC measurements
THE EUROPEAN REGIONAL DEVELOPMENT FUND AND THE MINISTRY OF INDUSTRY AND TRADE OF THE CZECH REPUBLIC SUPPORT INVESTMENT IN YOUR FUTURE
