Unispot DHP

Areas of application:

• High volume production testing
• Quality control
• Failure analysis
• Engineering testing

Wide range of components to test

• Bipolar transistors
• MOSFETs
• Diodes
• Zener diodes
• Voltage regulators
• IGBT

Competitive advantages

• Flexible and cost effective solution
• Flexible architecture allowing customized solutions
• Shortest test times possible thanks to smart system architecture
• Easy programming and debugging of test programs
• Planned extending to test other dynamic parameters
• Simple to use and maintain
• Life-cycle support

Features:

• Designed for discrete device DC tests
• High Current and High voltage capability
• True Multi-site capability and instruments multiple extension capability
• USIB –Unites Serial Control BUS. Allow true multi-site communication with instruments.
• HW-processing –instruments stand-alone operation for continuous power and fast testing
• Test Head with instruments + Main Frame with PC and DC Power unit

UNISPOT DHP is an automated test system with flexible architecture for discrete semiconductor DC testing. Focused on a wide range of parts from Small Signal Devices to High Power Discrete Devices up to 200A (option up to 1kA) and 2.5kV. Flexible architecture offer possibility of multi-site testing or test pins extension for testing full bridge IGBT modules. In its full configuration, the DHP system can provide up to 1000A/2500V in a true quad site configuration. Test time overhead can be cut to minimum thanks to its architecture.

Test system offers one test matrix MXHP_4A2B for one 4-pin device in a standard configuration. This matrix can be inserted multiple times for more-pin devices, such as full bridge IGBT modules, etc.

FFor currents higher than 200A a dedicated MXHP_2C matrix is designed, providing 2 pins up to 1kA.

You can register (left column) to obtain more information about the UNISPOT DHP test system.