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UNISPOT S40/S80 ACCEL

UNISPOT S40/S80 ACCEL is a newly designed top-class speed test system for mass production of small-signal discrete semiconductors.

Excellent productivity

Throughput up to 60,000 UPH
Test time up to 25 ms (diodes)

It is a dedicated test platform for different areas of applications and a wide range of components to test. Unispot S40/S80 Accel is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.

Areas of application:

High volume production testing
Quality control
Failure analysis
Engineering testing

Wide range of components to test

Bipolar transistors
MOSFETs
Diodes
Zener diodes
Voltage regulators
Low pin count devices

Test time

Bipolar transistors 35 ms
Diodes 25 ms

Competitive advantages

Throughput up to 60,000 UPH
Multisite&Carousel capability
Flexible and cost effective solution
Easy programming and debugging of test programs
Life-cycle support

HW specification

Multi-site and carousel capability
Flexible pin electronics
Extendable DUT pincounts
Minimized relays switching
Configurable measuring VI sources – CVI
Relays self-diagnostic on-the-fly
Wavwform generation capability on 100 kHz sample rate
SW calibration
Standart configuration of TH up to 4 CVI boards

Configurable CVI firmware for future enhancements

CVI – Combi VI sources

One CVI board designed for testing up to 3-pin device

2×VI source 30 V / 3 A
HV source 600 V / 10 mA
Leakage current meter from 100 nA range
Sophisticated switching matrix

CVIs can be grouped for testing multi devices or more pin devices

SCADUS – Smart Control and Development Universal Software

Test system control software.

Windows XP based
Engineering or Operator mode
Test data statistics support
Instrument debugger panels with source code generation
Delphi language programming
Offline development simulator
Versatile control of extension instruments such as GPIB, PCI, PXI, etc.

Application SW – TA107

Easy and fast menu – like TP programming
Wide library of standart test items
Test time per test and total test time
Test item editor for customer specific test items creation
Stop At Fail possibility to get shorter test time
SW scope tracer to analyze test conditions and results

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