Bench top test systems | UNITES Systems a.s. » Innovative ATE Solutions, semiconductor testing, test and measurement
Bench top test systems
Important notice: For customers, who wants to upgrade their current test system controlling PC, is important to purchase a PC having the PCI bus specification not higher than 2.2. In other case, the UNITES PCI communication will not work and might cause the computer to hang during boot.
UNIMET represents a unique and flexible mixed signal test platform for cost effective testing of a wide range of components. Unimet platforms consist of dozens of test adapters with hundreds of ready made test programs. Easy programming, debugging of test programs and life-cycle support.
Areas of application:
- Incoming inspections
- Low volume production testing
- Engineering testing
- Quality control
- Functonal testing
- Diagnostics
- Failure analysis
Wide range of components to test
- Linear device
- Passive device
- Hybrid device
- Mixed-signal device
- Power management
- Smart power device
- Voltage regulators
- Optocouplers
- Diodes
- Transistors
- AD / DA converters
- OpAmps
- Digital ICs
- JFETs
- Memories
UNIMET 3000
UNIMET 3000 represents a unique and flexible mixed signal test platform for cost effective testing of a wide range of components. This is basic configuration which is fully compatible with SZ M3000 test system, test programs and adapters and can be easily upgraded to UNIMET 4000. UNIMET platform consists of dozens of test adapters with hundreds of ready made test programs.
UNIMET 4000
UNIMET 4000 is a next step further and allows the use of all basic features and test adapters as UNIMET 3000 but extends its capabilities to allow testing more complex mixed-signal devices with advanced digital interfaces. Its advanced high speed serial bus enables to shorten the test time which makes it ideal for low volume production.
UNIMET 4000H
UNIMET 4000H represents a mixed-signal test platform for cost effective testing of hybrids or customer specific ICs. UNIMET 4000H uses digital pin electronics and various types of sources available for effective testing of hybrids. The standard test adapters cannot be used with UNIMET 4000H. The programming of the test applications is done under programming language DELPHI.
Test Adapters
Family test adapters are a set of SW and HW.
SW is mostly designed as menu-driven for users comfort. The user does not need standard compiler or dedicated language to make a test program e.g. for discrete devices.
Software for TAxx is fully integrated within SCADUS universal test SW. HW of TAxx contains additional instruments necessary to test dedicated family of devices.
A complete delivered package of TAxx contains also so called GOLDEN devices i. e. devices with protocolled test results and reference Socket Adapters with dedicated device socket and application circuitry.
- TA01 – Resistors, Capacitors, Inductors
- TA02B – Relays
- TA03B – Voltage regulators
- TA06B – Opto-couplers
- TA07B – Diodes & Zenner Diodes, Bipolar Transistors, MOS-FETs, Triacs & Thyristors
- TA08B – A/D D/A converters
- TA09B – Operational amplifiers
- TA10B – Digital ICs
- TA15B – SMART POWER devices
- TA16B – MEMORIES
- TA17B – VLSI & ASICS devices
- TA27B – Diodes & Zenner Diodes, Bipolar Transistors, MOS-FETs
- Avalanche adapter for TA27 – energy of switchers with reverse voltage
THE EUROPEAN REGIONAL DEVELOPMENT FUND AND THE MINISTRY OF INDUSTRY AND TRADE OF THE CZECH REPUBLIC SUPPORT INVESTMENT IN YOUR FUTURE
