EFFITEST e50

EFFITEST e50

EFFITEST e50 is ultra high-speed discrete semiconductor tester perfect for use in production

Download information leaflet here

Features

  • Force/measure up to 600V/6A
  • Connection to handler or wafer prober
  • Up to 32 HW bins and 256 SW bins
  • Throughput up to 60,000 UPH /  less than 35 ms to test a bipolar transistor
  • Parallel and serial testing
  • Virtual scope – internal instrument allowing display of waveforms
  • Menu-driven test editor for easy programming test programs
  • Final test & QA test ready
  • Life-cycle support

Testing

  • Bipolar transistors 
  • MOSFETs (also GaN and SiC)
  • Diodes & Zener diodes
  • Voltage regulators
  • LED, Photodiodes, Optocouplers 
  • Phototransistors 
  • MOSFET Drivers
  • IGBT Drivers

Learn more

 

Contact: 

 Ondřej Běťák            

Ondřej Běťák

Nahoru