EFFITEST e50

Download information leaflet here

Features

• Force/measure up to 600V/6A
• Connection to handler or wafer prober
• Up to 32 HW bins and 256 SW bins
• Throughput up to 60,000 UPH /  less than 35 ms to test a bipolar transistor
• Parallel and serial testing
• Virtual scope – internal instrument allowing display of waveforms
• Menu-driven test editor for easy programming test programs
• Final test & QA test ready
• Life-cycle support

Testing

• Bipolar transistors 
• MOSFETs (also GaN and SiC)
• Diodes & Zener diodes
• Voltage regulators
• LED, Photodiodes, Optocouplers 
• Phototransistors 
• MOSFET Drivers
• IGBT Drivers

Contact: 

 Ondřej Běťák