EFFITEST e50 is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 600V / 6A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors.


Download information leaflet here


  • Bipolar transistors (also GaN and SiC)
  • MOSFETs (also GaN and SiC)
  • Diodes
  • Zener diodes
  • Voltage regulators
  • LED, Optocouplers 
  • Photodiodes
  • Phototransistors 
  • MOSFET Drivers
  • IGBT Drivers
  • Low pin count devices


  • Easy to install and setup - less than 3 hours from create to test
  • Connection to handler or wafer prober
  • Very high speed test -  less than 35 ms to test a bipolar transistor
  • Throughput up to 60,000 UPH
  • Multisite and Carousel capability - split the test program in two to increase handler speed
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Reduced hardware set - decreases maintenance costs
  • SW auto calibration - calibration with external DMM available with one click
  • Easy programming and debugging of test programs
  • Configurable test head - one or two CVI’s can be placed on each test head
  • Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
  • Life-cycle support
  • Final test & QA test ready

    Virtual scope
        Virtual scope feature

Technical specification

  • Effitest e50 can force/measure 600V/6A
  • 1 CVI unit consists of - 2×VI sources 30V / 3A ( 1x30V / 6A in parallel mode), HV source 600V / 10mA and Leakage current meter from 10nA range
  • 2 four-quadrant and 1 two quadrant power supplies allow negative power bias on gate up to -30V (VI source) or -600V (HV source)
  • One CVI board designed for testing up to 10-pin by using external multiplexer unit
  • Parallel and Serial mode available
  • Up to 32 HW bins and 256 SW bins
  • Controlled by proven Windows 10 based IPC
  • Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box

              Four-quadrant scheme

Test time

  • Bipolar transistors <35 ms
  • Diodes <25 ms


(possibility to integrate measurement equipment from 3rd party vendors)

  • LED Spectrometer
  • LCR Bridge
  • Light Emitter (when testing photo diodes)
  • Converters for communication (ISELED, UART, I2C, etc.)
  • etc.

Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing



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