EFFITEST e80

EFFITEST e80

Effitest e80 is top-class high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest e80 is an ideal choice for testing IGBTs, MOS-FETs and other high power semiconductors.

 

Download datasheet here

Testing

  • Transistors (GaN, SiC, etc.)
  • MOS-FETs
  • IGBTs
  • MES-FETs
  • Diodes
  • Rectifiers
  • Bridges
  • SCRs
  • Hybrid modules
  • Power Devices
  • Power Transistors
  • Power Modules

Features

  • Easy to install and setup - less than 3 hours from crate to test (test menu editor is currently under development)
  • High speed test -  around 200 ms to test for high power MOS-FET
  • Full bridge IGBT modules testing
  • Throughput up to 20,000 UPH
  • Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
  • Reduced hardware set - decreases maintenance costs
  • SW auto calibration - calibration with external DMM available with one click
  • Easy programming and debugging of test programs (test menu editor is currently under development)
  • Configurable test head - one or two CVI’s can be placed on each test head
  • Life-cycle support


    Virtual scope
        Virtual scope feature

Technical specification

  • CVI unit consists of - 2×VI source 30 V / 3 A, HV source 600 V / 10 mA and Leakage current meter from 10 nA range
  • High Current Source VAS252 - 200A scalable up to 1000A
  • On-board dual 16-bit ADC for voltage and current measurement
  • High Voltage Source - VAS2500 -2500V to +2500V 
  • Kelvin matrix MX_4A2B - with on board self-test
  • Hi-current matrix MX_2C - with on board self-test
  • Digitizer & Time Measurement Unit
  • Resolution 14 bit force
  • Resolution 16 bit measure


              Four-quadrant scheme of VAS 252

 

Areas of application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing

 

Contact: 

 Ondřej Běťák            

Ondřej Běťák

 

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