Kategorie
UNITES Systems a.s.
Kpt. Macha 1372
757 01 Valašské Meziříčí
T: 571 757 230
E: info@unites.cz
IČ: 25863665 DIČ: CZ25863665
Effitest e50
Areas of application:
- High volume production testing
- Quality control
- Failure analysis
- Engineering testing
Wide range of components to test
- Bipolar transistors
- MOSFETs
- Diodes
- Zener diodes
- Voltage regulators
- Low pin count devices
Test time
- Bipolar transistors 35 ms
- Diodes 25 ms
Competitive advantages
General
- Easy to install and setup - less than 3 hours from crate to test
- Very easy to adapt to the handler - 3 pieces of hardware that can be placed separately around the handler, or together in a stand
- Final test and Quality assurance test with dedicated hardware - one CVI test instrument, dedicated to a handler test station, can test a 3lead device
- Very high speed test - only 35 ms to test a bipolar transistor
- Throughput up to 60,000 UPH
- Multisite and Carousel capability - split the test program in two to increase handler speed
- Flexible and cost effective solution
- Reduced hardware set - decreases maintenance costs
- Easy programming and debugging of test programs
- Configurable test head - one or two CVI’s can be placed on each test head
- Life-cycle support
Hardware
- Configurable measuring, multiple VI sources - 2x 4 quadrant VI source 30V/3A, 1x 600V/ 10mA VI source, leakage current measurement unit
- Minimized relay switching - no relay on the CVI board. All relays are in the configuration board, attached to the CVI
- Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
- Very high speed test - it takes only 35 ms to test a bipolar transistor, 25ms for a diode
- Upgradeable CVI firmware - no additional hardware needed for the upgrade
- Waveform capture and generation - 100kHz sample rate for both capture and generation waveforms
Software
- Extensive parameter library - all common parameters for discrete testing are available
- Powerful test editor - one can edit, modify or create parameters and the code is automatically generated
- Scope function - see all wave forms to help on debugging or optimizing any parameter
- Complete self test routine - executes a complete check, relays included, to all the hardware
- Calibration procedure - calibration with external meter available with one click
- Production and engineering modes - limited functions on the production screen for mishandling protection
HW Specification
- Multi-site and carousel capability
- Flexible pin electronics
- Extendable DUT pincounts
- Minimized relays switching
- Configurable measuring VI sources – CVI
- Relays self-diagnostic on-the-fly
- Waveform generation capability on 100 kHz sample rate
- SW calibration
Standard configuration of TH up to 4 CVI boards
- Configurable CVI firmware for future enhancements
- CVI – Combi VI sources
- One CVI board designed for testing up to 3-pin device
- 2×VI source 30 V / 3 A
- HV source 600 V / 10 mA
- Leakage current meter from 100 nA range
- Sophisticated switching matrix
CVIs can be grouped for testing multi devices or more pin devices
SCADUS
– Smart Control and Development Universal Software Test system control software.
- Windows based
- Engineering or Operator mode
- Test data statistics support
- Instrument debugger panels with source code generation
- Delphi language programming
- Offline development simulator
- Versatile control of extension instruments such as GPIB, PCI, PXI, etc.
Application SW – TA107
- Easy and fast menu – like TP programming
- Wide library of standart test items
- Test time per test and total test time
- Test item editor for customer specific test items creation
- Stop At Fail possibility to get shorter test time
- SW scope tracer to analyze test conditions and results
It is a dedicated test platform for different areas of applications and a wide range of components to test. effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.