UNITES Systems a.s.
Kpt. Macha 1372
757 01 Valašské Meziříčí
T: 571 757 230
E: info@unites.cz
IČ: 25863665   DIČ: CZ25863665

Kontakty

Test Adaptéry UNIMET

Test Adaptéry UNIMET

"Family" test-adaptéry jsou obvykle sadou SW a HW.

SW je většinou navržen jako prostředí pro komfort uživatelů. Uživatel nepotřebuje standardní překladač nebo vyhrazený jazyk, aby vytvořil testovací program, např. pro diskrétní součástky.

Software pro TAxx je plně integrován do univerzálního testovacího softwaru SCADUS. HW TAxx obsahuje další nástroje potřebné k otestování vyhrazené rodiny zařízení.

Kompletní dodávaný balíček TAxx obsahuje také tzv. "zlaté vzorky" součástek, tj. součástky s protokolovanými výsledky testů a referenční socket adaptéry se speciální paticí a aplikačními obvody.

RLC | Monostable relays, Bistable relays with 1 or 2 coils |  RegulatorsOptocouplers with analog I/O, 1–4 devices in packageBipolar Transistors (NPN, PNP, Low power, Darlington, Field effect transistors (N-channel, P-channel, Power-MOS), Diodes, Zenner diodes, Arrays, 2000V optional | A/D Converters, D/A Converters, Sample & Hold devices, Voltage referencesOperational amplifiers , Comparators, Chopper OA | CMOS, HCMOS, NMOS , PMOS , TTL (LS, ALS, S, FAST, etc.), DTL, HTL, ECL | Low side switches, High side switches | Static RAM, ROM, PROM, EPROM, EEPROM | Processors and peripheries, Memories, Logic arrays, TTL logic devices | Bipolar transistors (NPN, PNP, Low power, Darlington), Field effect transistors (N-channel, P-channel, Power-MOS), Diodes, Zener diodes, Arrays, 2 000 V optional | Avalance energy

TA01

RLC  Test Adapter. 

Testing:

  • Resistors
  • Capacitors
  • Inductors

You can measure resistance, capacitance and inductance. You also can set up a reference value and compare in percent points the deviation from reference value. For capacitors and inductors adapter measures also tangens delta – 1/Q value.

 

TA02B

Testing: Monostable relays, Bistable relays with 1 or 2 coils.

Testable parameters:

  • Coil resistance RCOIL
  • Diode forward voltage Vtwd
  • Case test ICASE
  • Contact resistance RCONTACT
  • Leakage current Ileak
  • Function test FCT
  • Pickup energization Voperate, Ioperate
  • Dropout energization Vrelease, Irelease
  • Operate time toperate, (V), (I)
  • Release time trelease, (V), (I)
  • Transit time ttransit, (V), (I)
  • Synchronicity tsync
  • Bounce time tbounce
  • Bounce number nbounce

 

TA03B

Testing: Regulators

  • Output voltage Vo
  • Line regulation RegLine
  • Load regulation RegLoad
  • Quiescent current Iq
  • Ripple rejection SVR
  • Reset leakage current Ileak
  • Short circuit current Isc
  • Dropout voltage DOV
  • Reset delay time Tres
  • Reset pulse width Trpw
  • Reset output voltage Vres

 

TA06B

Testing: Optocouplers with analog I/O, 1–4 devices in package.

  • Current Transfer Ratio CTR
  • Saturation Voltage or Output Voltage Vsat, Vout
  • Dark Current or Output Current IOH, IOUT
  • Diode Forward Voltage or Input Voltage Vfd, Vin
  • Diode Breakdown Voltage Vbr
  • Switch-on Time ton
  • Switch-off Time toff
  • Reverse Current or Input Current Iin
  • Supply Current ICC
  • Output Short Current IOS
  • Enable Current IE
  • Threshold or Hysteresis Currents/Voltages I/UTH

 

TA07B

Testing: Bipolar Transistors (NPN, PNP, Low power, Darlington, Field effect transistors (N-channel, P-channel, Power-MOS), Diodes, Zenner diodes, Arrays, 2000V optional.

Parameters - Bipolar Transistors

  • Breakdown voltage VCE0(BR)
  • Breakdown voltage VCES(BR)
  • Saturation voltage VCE(sat)
  • Saturation voltage VCB0
  • Breakdown voltage VCB0
  • Breakdown voltage VEB0
  • Diode forward voltage VF(diode)
  • Collector/Emitter cutoff current ICEO, ICBO, IEBO
  • On voltage VBE(on)
  • DC current gain hfe(DC)
  • AC current gain h21e(AC)

Parameters – Triacs & Thyristors

  • Gate trigger current IGT
  • Gate trigger voltage VGT
  • Off-state leakage current IDO
  • Hold current IH
  • Latch current IL

Parameters – Diodes & Zenner Diodes

  • Forward voltage VF
  • Reverse voltage VR
  • Zenner voltage VZ
  • Reverse leakage current IR
  • Dynamic resistance DC RDdyn
  • Dynamic resistance AC Rz

Parameters – MOS-FETs

  • Breakdown voltage V(BR)DSS
  • Inverse diode voltage VSD
  • Gate threshold voltage VGS
  • On resistance RDS(on)
  • Forward transconductance gfs
  • Forward/Reverse leakage current IGSS
  • On voltage VDS(on)
  • On-state drain current ID(on)

 

TA08B

Testing: A/D Converters, D/A Converters, Sample & Hold devices, Voltage references.

 

TA09B

Testing: Operational amplifiers, Comparators, Chopper OA.

  • Input offset voltage VOS
  • Offset voltage adjustment range
  • Positive / negative supply current VRGOS
  • Input bias current IB
  • Input bias current IB+/IB
  • Input offset current IOS
  • Large signal voltage gain AVO
  • Slew rate ±SR+/SR
  • Common mode rejection ratio CMRR
  • Power supply rejection ratio PSRR+/PSRR
  • Output voltage swing VO+/VO
  • Gain bandwidth product GBP
  • Forward transductance GM
  • Short circuit current ISC
  • Function test FCT

 

TA10B

Testing: CMOS, HCMOS, NMOS, PMOS, TTL (LS, ALS, S, FAST, etc.), DTL, HTL, ECL.

 

TA15B

Testing: Low side switches, High side switches.

  • 6 programmable reference sources
  • Power source 45V/100A (peak)
  • Pin driver ±12V
  • Differential amplifier
  • Expansion VI-Source PSM51 ±51V/5A

 

TA16B

Testing: Static RAM, ROM, PROM, EPROM, EEPROM.

  • Addres bits 0…16
  • Data bits 0…16
  • Control bits 0…7
  • Access time 0…630ms
  • Programmable sources voltage/current, counters and the others instruments

 

TA17B

Testing: Processors and peripheries, Memories, Logic arrays, TTL logic devices.

Test Groups Architecture

  • 48 bidirectional test signals
  • Data rate up to 10 MHz
  • Hardware test evaluating in the input mode
  • Expected data stored in the output channel
  • Input data compared with the expected data
  • Fail marks of the input vectors stored
  • 10-bit fail events counter

Parameters

  • Parameter - Group 0 - Groups 1 .. 5
  • Signals Number
    • 8 bidirectional
  • Pattern Out Depth
    • 2048 (Standard) 
    • 32768 (max)
  • Pattern In Depth
    • 2048 (Standard) 
    • 32768 (max)
  • Direction Control
    • single (In or Out)
      • common (In or Out)
  • Output Timing
    • single (Start/Stop)
      • common (Start/Stop)
  • Input Timing common (Load Point)
  • Format Control common
  • Output Format *
    • return-to-zero 
    • return-to-one 
    • surround-by-complement 
    • non-return
  • Input Format
    • data 
      • data 
      • fail marks 
      • fail number (0..65535)
  • FIFO Unit Control
    • Reset and Retransmit
  • FIFO Unit Flags
    • Empty and Full
  • Synchronization
    • independent In and Out
  • Output Low Level
    • 0.3 V .. 5.5 V
  • Output High Level
    • 0.3 V .. 5.5 V
  • Input Threshold
    • 0.3 V .. 5.5 V
  • Timing Range
    • 255 ns or 1275 ns

„*“ for all pins in the group

 

TA27B

Test Adapter TA 27 B is a modernized adapter of former M3000 TA 07 B family test adapter for UNIMET test system. TA 27 B is also expandable with Avalanche test adapter.

Testing: Bipolar transistors (NPN, PNP, Low power, Darlington), Field effect transistors (N-channel, P-channel, Power-MOS), Diodes, Zener diodes, Arrays, 2 000 V optional.

Parameters – Diodes & Zenner Diodes

  • Forward voltage VF
  • Reverse voltage VR
  • Zenner voltage VZ
  • Reverse leakage current IR
  • Dynamic resistance DC Rdyn
  • Dynamic resistance AC Rz

Parameters – Bipolar Transistors

  • Breakdown voltage VCE0(BR)
  • Breakdown voltage VCES(BR)
  • Saturation voltage VCE(sat)
  • Saturation voltage VBE(sat)
  • Breakdown voltage VCB0
  • Breakdown voltage VEB0
  • Diode forward voltage VF(diode)
  • Collector/Emitter cutoff current ICEO,ICBO,IEBO
  • On voltage VBE(on)
  • DC current gain hfe(DC)
  • AC current gain H21e(AC)

Parameters – MOS-FETs

  • Breakdown voltage V(BR)DSS
  • Inverse diode voltage VSD
  • Gate threshold voltage VGS
  • On resistance RDS(on)
  • Forward transconductance gfs
  • Forward/Reverse leakage current IGSS
  • On voltage VDS(on)
  • On-state drain current ID(on)

 

Avalanche adapter for TA27

Avalanche adapter is used together with TA 27B family test adapter. Avalanche adapter tests avalanche energy of the switchers with reverse voltage to 100 V. The avalanche energy is energy absorbed by the semiconductor switch while switching of an inductive load. Now we can test with this adapter Low-side FET switches.

Basic technical features

  • Avalanche energy up to 3 J
  • Current before switch-off 100 A
  • Graphic user interface

Tested parameters

  • D-S Breakdown voltage VBRDSS
  • Gate Threshold Voltage VGS
  • Inverse diode Forward Voltage VSD
  • Forward G-S Leakage Current IGSS
  • Reverse G-S Leakage Current IGSS
  • Zero Gate Voltage Drain cur. IDSS
  • D-S On Resistance RDSon
  • Forward Trans-conductance gfs
Nahoru