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UNITES Systems a.s.
Kpt. Macha 1372
757 01 Valašské Meziříčí
Czech republic
T: +420 571 757 230
E: info@unites.cz
EFFITEST e50
EFFITEST e50 is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 600V / 6A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors.
Download datasheet here
Testing
- Bipolar transistors (also GaN and SiC)
- MOSFETs (also GaN and SiC)
- Diodes
- Zener diodes
- Voltage regulators
- LED, Optocouplers
- Photodiodes
- Phototransistors
- MOSFET Drivers
- IGBT Drivers
- Low pin count devices
Features
- Easy to install and setup - less than 3 hours from create to test
- Very high speed test - less than 35 ms to test a bipolar transistor
- Throughput up to 60,000 UPH
- Multisite and Carousel capability - split the test program in two to increase handler speed
- Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
- Reduced hardware set - decreases maintenance costs
- SW auto calibration - calibration with external DMM available with one click
- Easy programming and debugging of test programs
- Configurable test head - one or two CVI’s can be placed on each test head
- Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
- Life-cycle support
Virtual scope feature
Technical specification
- Effitest e50 is capable of 600V/6A
- 1 CVI unit consists of - 2×VI sources 30V / 3A ( 1x30V / 6A in parallel mode), HV source 600V / 10mA and Leakage current meter from 10nA range
- 2 four-quadrant and 1 two quadrant power supplies allow negative power bias on gate up to -30V (VI source) or -600V (HV source)
- One CVI board designed for testing up to 3-pin device, extendable to 10-pin by using external multiplexer unit
- Additional Multiplexer allowing measurement up to 10-pin components
- CVIs can be grouped for testing multi devices or more pin devices
- Controlled by proven Windows 10 based IPC
- Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
Four-quadrant scheme
Test time
- Bipolar transistors <35 ms
- Diodes <25 ms
Extendability
(possibility to integrate measurement equipment from 3rd party vendors)
- LED Spectrometer
- LCR Bridge
- Light Emitter (when testing photo diodes)
- Converters for communication (ISELED, UART, I2C, etc.)
- etc.
Areas of application
- High volume production testing
- Quality control
- Failure analysis
- Engineering testing
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