EFFITEST e50

Testing

• Bipolar transistors
• MOSFETs
• Diodes
• Zener diodes
• Voltage regulators
• LED, Optocouplers 
• Photodiodes
• Phototransistors 
• MOSFET Drivers
• IGBT Drivers
• Low pin count devices

Features

• Easy to install and setup - less than 3 hours from crate to test
• Very high speed test -  less than 35 ms to test a bipolar transistor
• Throughput up to 60,000 UPH
• Multisite and Carousel capability - split the test program in two to increase handler speed
• Virtual scope – internal instrument allowing display of measured parameters – voltages, currents, etc. with 100kHz sample rate
• Reduced hardware set - decreases maintenance costs
• SW auto calibration - calibration with external DMM available with one click
• Easy programming and debugging of test programs
• Configurable test head - one or two CVI’s can be placed on each test head
• Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
• Life-cycle support
  
  
  
      Virtual scope feature

Technical specification

• CVI means Combi VI – equivalent of Source Measurement Unit
• 1 CVI unit consists of - 2×VI source 30 V / 3 A, HV source 600 V / 10 mA and Leakage current meter from 100 nA range
• One CVI board designed for testing up to 3-pin device
• Additional Multiplexer allowing measurement up to 10-pin components
• CVIs can be grouped for testing multi devices or more pin devices
• Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box

              Four-quadrant scheme

Test time

• Bipolar transistors <35 ms
• Diodes <25 ms

Extendability

(possibility to integrate measurement equipment from 3rd party vendors)

• LED Spectrometer
• LCR Bridge
• etc.

Areas of application

• High volume production testing
• Quality control
• Failure analysis
• Engineering testing

Contact: 

 Ondřej Běťák