EFFITEST e50

EFFITEST e50 is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 600V / 6A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors.

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Features

Force/measure up to 600V/6A
Connection to a handler or a wafer prober
Up to 32 HW bins and 256 SW bins
Throughput up to 60,000 UPH / less than 35 ms to test a bipolar transistor
Parallel and serial testing
Virtual scope – internal instrument allowing display of waveforms
Menu-driven test editor for easy programming test programs
Final test & QA test ready

Testing

Bipolar transistors
MOSFETs (also GaN and SiC)
Diodes & Zener diodes
Voltage regulators
LED, Photodiodes, Optocouplers
Phototransistors
MOSFET Drivers
IGBT Drivers

Contact:

Ondřej Běťák