Effitest E50

Areas of application:

• High volume production testing
• Quality control
• Failure analysis
• Engineering testing

Wide range of components to test

• Bipolar transistors
• MOSFETs
• Diodes
• Zener diodes
• Voltage regulators
• Low pin count devices

Test time

• Bipolar transistors 35 ms
• Diodes 25 ms

Competitive advantages

General

• Easy to install and setup - less than 3 hours from crate to test
• Very easy to adapt to the handler - 3 pieces of hardware that can be placed separately around the handler, or together in a stand
• Final test and Quality assurance test with dedicated hardware - one CVI test instrument, dedicated to a handler test station, can test a 3lead device
• Very high speed test - only 35 ms to test a bipolar transistor
• Throughput up to 60,000 UPH
• Multisite and Carousel capability - split the test program in two to increase handler speed
• Flexible and cost effective solution
• Reduced hardware set - decreases maintenance costs
• Easy programming and debugging of test programs
• Configurable test head - one or two CVI’s can be placed on each test head
• Life-cycle support

Hardware

• Configurable measuring, multiple VI sources - 2x 4 quadrant VI source 30V/3A, 1x 600V/ 10mA VI source, leakage current measurement unit
• Minimized relay switching - no relay on the CVI board. All relays are in the configuration board, attached to the CVI
• Small and compact power box - all the necessary power supplies in a 550mm x 170mm x 350mm box
• Very high speed test - it takes only 35 ms to test a bipolar transistor, 25ms for a diode
• Upgradeable CVI firmware - no additional hardware needed for the upgrade
• Waveform capture and generation - 100kHz sample rate for both capture and generation waveforms

Software

• Extensive parameter library - all common parameters for discrete testing are available
• Powerful test editor - one can edit, modify or create parameters and the code is automatically generated
• Scope function - see all wave forms to help on debugging or optimizing any parameter
• Complete self test routine - executes a complete check, relays included, to all the hardware
• Calibration procedure - calibration with external meter available with one click
• Production and engineering modes - limited functions on the production screen for mishandling protection

HW Specification

• Multi-site and carousel capability
• Flexible pin electronics
• Extendable DUT pincounts
• Minimized relays switching
• Configurable measuring VI sources – CVI
• Relays self-diagnostic on-the-fly
• Waveform generation capability on 100 kHz sample rate
• SW calibration

Standard configuration of TH up to 4 CVI boards

• Configurable CVI firmware for future enhancements
• CVI – Combi VI sources
• One CVI board designed for testing up to 3-pin device
• 2×VI source 30 V / 3 A
• HV source 600 V / 10 mA
• Leakage current meter from 100 nA range
• Sophisticated switching matrix

CVIs can be grouped for testing multi devices or more pin devices
 

SCADUS

– Smart Control and Development Universal Software Test system control software.

• Windows based
• Engineering or Operator mode
• Test data statistics support
• Instrument debugger panels with source code generation
• Delphi language programming
• Offline development simulator
• Versatile control of extension instruments such as GPIB, PCI, PXI, etc.

Application SW – TA107

• Easy and fast menu – like TP programming
• Wide library of standart test items
• Test time per test and total test time
• Test item editor for customer specific test items creation
• Stop At Fail possibility to get shorter test time
• SW scope tracer to analyze test conditions and results

It is a dedicated test platform for different areas of applications and a wide range of components to test. effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
 

Contact: 

 Ondřej Běťák