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UNITES Systems a.s.
Kpt. Macha 1372
757 01 Valašské Meziříčí
Czech republic
T: +420 571 757 230
E: info@unites.cz
EFFITEST e50
EFFITEST e50 is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 60.000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 600V / 6A. Lowest current range is 10nA. Ideal also for GaN and SiC transistors.
Download information leaflet here
Features
- Force/measure up to 600V/6A
- Connection to a handler or a wafer prober
- Up to 32 HW bins and 256 SW bins
- Throughput up to 60,000 UPH / less than 35 ms to test a bipolar transistor
- Parallel and serial testing
- Virtual scope – internal instrument allowing display of waveforms
- Menu-driven test editor for easy programming test programs
- Final test & QA test ready
Testing
- Bipolar transistors
- MOSFETs (also GaN and SiC)
- Diodes & Zener diodes
- Voltage regulators
- LED, Photodiodes, Optocouplers
- Phototransistors
- MOSFET Drivers
- IGBT Drivers